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Statistical validation of WLAN range calculated with propagation models for industrial environments by chipset-level received signal strength measurements

✍ Scribed by Tanghe, E.; Joseph, W.; Verloock, L.; Martens, L.; Capoen, H.; Van Herwegen, K.; Buysschaert, T.


Book ID
114445301
Publisher
The Institution of Engineering and Technology
Year
2009
Tongue
English
Weight
880 KB
Volume
3
Category
Article
ISSN
1751-8822

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