Statistical Test Development for Analog Circuits Under High Process Variations

✍ Scribed by Fang Liu; Ozev, S.

• Book ID: 118698507
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 473 KB
• Volume: 26
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2007.891373