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Statistical recognition of offset components and evaluation of sphericity error for ultra-high-precision sphere: Tan Jiu-Bin; Li Dong-Sheng; Qiang Xi-Fu; Yang Wen-Guo; Zhao Hai. SPIE - Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 1245–1251


Book ID
107889274
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
265 KB
Volume
16
Category
Article
ISSN
0141-6359

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