Statistical Model for MOSFET Bias Temperature Instability Component Due to Charge Trapping

✍ Scribed by Wirth, G.I.; da Silva, R.; Kaczer, B.

• Book ID: 114620561
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 504 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2157828