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Statistical model for a failure mode and effects analysis and its application to computer fault-tracing : Henry Ohlef, William Binroth and Roger Haboush. IEEE Trans. Reliab.R-27, (1) 16 (April 1978)


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
125 KB
Volume
18
Category
Article
ISSN
0026-2714

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