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Statistical model-based damage detection and localization: subspace-based residuals and damage-to-noise sensitivity ratios

✍ Scribed by M. Basseville; L. Mevel; M. Goursat

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 349 KB
Volume: 275
Category: Article
ISSN: 0022-460X
DOI: 10.1016/j.jsv.2003.07.016

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