A new method is presented to evaluate the series resistance of a solar cell. The method not only takes into account the effects of light and temperature on the series resistance, but also takes the diode junction ideality factor as an output current dependent parameter such that the values of the re
✦ LIBER ✦
Statistical Evaluation of a Luminescence-Based Method for Imaging the Series Resistance of Solar Cells
✍ Scribed by H. Höffler; J. Haunschild; R. Zeidler; S. Rein
- Book ID
- 116427164
- Publisher
- Elsevier
- Year
- 2012
- Weight
- 796 KB
- Volume
- 27
- Category
- Article
- ISSN
- 1876-6102
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