✦ LIBER ✦

Statistical construction of accurate CAD models using measured data

✍ Scribed by Krishna Naishadham; William Leiker

Publisher: John Wiley and Sons
Year: 2002
Tongue: English
Weight: 740 KB
Volume: 33
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.10284

No coin nor oath required. For personal study only.

✦ Synopsis

Abstract

Component models available in CAD software do not consider the statistical variation and the layout‐ or package‐specific parasitic effects of components. Because of the complexity of device packages, the well‐established EM simulation alternative can only be applied to relatively simple circuits. This Letter presents a methodology to construct statistically a representative component model from a measured database, and show how such a model can be used in a circuit simulator for effective circuit design. All the parasitic effects of the circuit components are incorporated through measurements. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 233–238, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10284

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