Statistical analysis of the stereolithographic process to improve the accuracy
β Scribed by S.L. Campanelli; G. Cardano; R. Giannoccaro; A.D. Ludovico; E.L.J. Bohez
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 661 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0010-4485
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β¦ Synopsis
Stereolithography (SL) is a widely used technology in the field of rapid prototyping. However, the dimensional accuracy of SL products is today still limited; therefore, this technology needs to be optimized for high precision applications. This paper presents a statistical analysis of the stereolithographic process, in order to find out the combination of parameters leading to the best accuracy of the manufactured parts. A particular benchmark was designed and a global error index was introduced to evaluate the global distortion of built parts. The Taguchi methodology was employed for the optimization. A Viper Si 2 machine by 3D Systems was used in both the modalities allowed from this system: Normal and High Resolution.
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