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Statistical analysis of the Doppler broadening coincidence spectrum of electron–positron annihilation radiation in silicon

✍ Scribed by E. do Nascimento; O. Helene; V.R. Vanin; M.T.F. da Cruz; M. Moralles

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 586 KB
Volume: 609
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2009.07.051

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