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Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates

✍ Scribed by Rita Van Ham; Annemie Adriaens; Paolo Prati; Alessandro Zucchiatti; Luc Van Vaeck; Freddy Adams


Book ID
114377740
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
344 KB
Volume
36
Category
Article
ISSN
1352-2310

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