Static-noise margin analysis for a scaled-down CMOS memory cell

✍ Scribed by Takakuni Douseki; Shin-Ichiro Mutoh

• Book ID: 112078713
• Publisher: John Wiley and Sons
• Year: 1992
• Tongue: English
• Weight: 785 KB
• Volume: 75
• Category: Article
• ISSN: 8756-663X
• DOI: 10.1002/ecjb.4420751111