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Static dielectric constant of isolated silicon nanocrystals embedded in a SiO2 thin film

✍ Scribed by Ng, C. Y.; Chen, T. P.; Ding, L.; Liu, Y.; Tse, M. S.; Fung, S.; Dong, Z. L.

Book ID
111874153
Publisher
American Institute of Physics
Year
2006
Tongue
English
Weight
369 KB
Volume
88
Category
Article
ISSN
0003-6951

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Optical properties of embedded ZnTe nano
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## Abstract We have studied the optical properties of ZnTe nanocrystals (ZnTe‐nc) embedded in a SiO~2~ matrix by spectroscopic ellipsometry. The ZnTe‐nc are embedded in a SiO~2~ matrix by ion implantation technique. The dose of 2.9 × 10^16^ cm^βˆ’2^ of tellurium and zinc ions are implanted in a 250 n