Static characteristics of the metal-insulator-semiconductor-insulator-metal (MISIM) structure—II. Low frequency capacitance : Z. Djuric, M. Smiljanic and D. Tjapkin. Solid State Electronics18, 827 (1975)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 127 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90120-7