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State of art of reliability practice in the European Computer Market : M. Vischi. Proceedings of the 1972 Annual Reliability and Maintainability Symposium, San Francisco. IEEE Cat. No. 72CH0577-7R. 25–27 January (1972), p. 329

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 83 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90599-4

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