Standardization of line-scan NIR imaging systems
β Scribed by Zheng Liu; Honglu Yu; John F. MacGregor
- Book ID
- 101831672
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 380 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0886-9383
- DOI
- 10.1002/cem.1038
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β¦ Synopsis
Abstract
A simple and easy to use method is proposed for standardizing NIR imaging systems for differences among detectors in the chargeβcoupled device (CCD) array and illumination unevenness. The standardization equations are then used to preβtreat NIR image data to reduce the systematic errors introduced by a lineβscan NIR imaging system. The method requires only easily available homogeneous standards with relatively uniform spectral response. The effectiveness of the standardization in reducing the pixelβtoβpixel biases and other systematic effects is illustrated with examples, and the improved sensitivity in results obtained from a multivariate image analysis (MIA) based on multiβway principal component analysis (MPCA) is demonstrated. Copyright Β© 2007 John Wiley & Sons, Ltd.
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