Stand-by redundancy complex system's reliability : R. C. Garg and C. M. Sharma. Microelectron. & Reliab.12, 321 (1973)

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 107 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90150-4