Stacking faults in silicon carbide (6H) as observed by means of transmission electron microscopy

✍ Scribed by J. Van Landuyt; S. Amelinckx

• Book ID: 113183900
• Publisher: Elsevier Science
• Year: 1971
• Tongue: English
• Weight: 722 KB
• Volume: 6
• Category: Article
• ISSN: 0025-5408
• DOI: 10.1016/0025-5408(71)90010-9