Stacked gate mid-channel injection flash EEPROM cell-Part II: analysis of gate current and modeling of programming characteristics

✍ Scribed by Kim, D.M.; Cho, M.K.; Kwon, W.H.

• Book ID: 114537385
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 251 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.704368