Stable Ge–H phase at 620 K on Si1−xGex/Si(001) surface: a high-resolution electron energy loss spectroscopy study

✍ Scribed by T Angot; R Chelly

• Book ID: 117218105
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 126 KB
• Volume: 402-404
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(97)01018-2