Stability of Se passivation layers on Si(001) surfaces characterized by time-of-flight positron annihilation induced Auger electron spectroscopy

✍ Scribed by Zhu, J. G.; Nadesalingam, M. P.; Weiss, A. H.; Tao, M.

• Book ID: 121715114
• Publisher: American Institute of Physics
• Year: 2005
• Tongue: English
• Weight: 431 KB
• Volume: 97
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1897488