Stability degradation factors evaluated by phase noise measurement in an optical-microwave frequency link using an optical frequency comb

✍ Scribed by Inaba, H.; Yanagimachi, S.; Feng-Lei Hong; Onae, A.; Koga, Y.; Matsumoto, H.

• Book ID: 114629774
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 338 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2004.843113