๐”– Bobbio Scriptorium
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Stability and deterioration mechanism of thick-film resistors

โœ Scribed by Y. Taketa; M. Haradome

Book ID
112080308
Publisher
John Wiley and Sons
Year
1974
Tongue
English
Weight
451 KB
Volume
94
Category
Article
ISSN
0424-7760

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โœ Wilfried Schoepe ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 158 KB

The conductivity of a commercial thick-film resistor is measured between 4 K and 15 mK and in magnetic fields up to 7 Tesla. The data can be described by the variable-range hopping mechanism with a Coulomb gap in the density of states. The negative magnetoresistance may be attributed to quantum-inte