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Sputtering-induced surface roughness of metallic thin films

✍ Scribed by D. Marton; J. Fine


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
600 KB
Volume
185
Category
Article
ISSN
0040-6090

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Sputtering-induced surface roughness of
✍ WΓΆhner, T.; Ecke, G.; Râßler, H.; Hofmann, S. πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 495 KB πŸ‘ 2 views

Sputtering-induced surface roughness is the main source of degradation of the depth resolution observed during depth proÐling of polycrystalline metals. Atomic force microscopy (AFM) images of polycrystalline Al Ðlms at di †erent mean sputtered depths are used to calculate both the depth distributio