✦ LIBER ✦
Sputter depth profiles of Ni/Cr thin-film structures obtained from the emission of Auger electrons na x-rays: Joseph Fine et al, J Vac Sci Technol, 20 (3), 1982, 449–452
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 176 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0042-207X
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