✦ LIBER ✦

[Springer Series in Surface Sciences] Surface Science Techniques Volume 51 || X-Ray Reflectivity

✍ Scribed by Bracco, Gianangelo; Holst, Bodil

Book ID: 120315168
Publisher: Springer Berlin Heidelberg
Year: 2013
Weight: 960 KB
Category: Article
ISBN: 3642342434
DOI: 10.1007/978-3-642-34243-1_7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[Springer Series in Surface Sciences] Su

[Springer Series in Surface Sciences] Surface Science Techniques Volume 51 || Surface Structure Analysis with X-Ray Standing Waves

✍ Bracco, Gianangelo; Holst, Bodil 📂 Article 📅 2013 🏛 Springer Berlin Heidelberg ⚖ 983 KB

[Springer Series in Surface Sciences] Su

[Springer Series in Surface Sciences] Surface Science Techniques Volume 51 || The Helium Spin-Echo Method

✍ Bracco, Gianangelo; Holst, Bodil 📂 Article 📅 2013 🏛 Springer Berlin Heidelberg ⚖ 913 KB

[Springer Series in Surface Sciences] Su

[Springer Series in Surface Sciences] Surface Science Techniques Volume 51 || Diffraction of H2 from Metal Surfaces

✍ Bracco, Gianangelo; Holst, Bodil 📂 Article 📅 2013 🏛 Springer Berlin Heidelberg ⚖ 870 KB

[Springer Series in Surface Sciences] Su

[Springer Series in Surface Sciences] Surface Science Techniques Volume 51 || Advanced Applications of NEXAFS Spectroscopy for Functionalized Surfaces

✍ Bracco, Gianangelo; Holst, Bodil 📂 Article 📅 2013 🏛 Springer Berlin Heidelberg ⚖ 703 KB

[Springer Series in Surface Sciences] Su

[Springer Series in Surface Sciences] Surface Science Techniques Volume 51 || Probing Surfaces with Thermal He Atoms: Scattering and Microscopy with a Soft Touch

✍ Bracco, Gianangelo; Holst, Bodil 📂 Article 📅 2013 🏛 Springer Berlin Heidelberg ⚖ 862 KB

[Springer Series in Surface Sciences] Au

[Springer Series in Surface Sciences] Auger- and X-Ray Photoelectron Spectroscopy in Materials Science Volume 49 || Instrumentation

✍ Hofmann, Siegfried 📂 Article 📅 2012 🏛 Springer Berlin Heidelberg 🌐 English ⚖ 1011 KB

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with