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✦   LIBER   ✦

[Springer Series in Surface Sciences] New Horizons of Applied Scanning Electron Microscopy Volume 45 || Application Example 4: Nano Inclusions in Co-Hardened Gold Plating for Electronic Applications – Further Evidence for High Lateral Resolution in Low-Voltage, High-Angle BSE Imaging

✍ Scribed by Shimizu, Kenichi; Mitani, Tomoaki


Book ID
115497485
Publisher
Springer Berlin Heidelberg
Year
2009
Tongue
English
Weight
242 KB
Edition
1
Category
Article
ISBN
3642031609

No coin nor oath required. For personal study only.

✦ Synopsis


In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.


📜 SIMILAR VOLUMES


[Springer Series in Surface Sciences] Ne
✍ Shimizu, Kenichi; Mitani, Tomoaki 📂 Article 📅 2009 🏛 Springer Berlin Heidelberg 🌐 English ⚖ 178 KB

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realize

[Springer Series in Surface Sciences] Ne
✍ Shimizu, Kenichi; Mitani, Tomoaki 📂 Article 📅 2009 🏛 Springer Berlin Heidelberg 🌐 English ⚖ 263 KB

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realize

[Springer Series in Surface Sciences] Ne
✍ Shimizu, Kenichi; Mitani, Tomoaki 📂 Article 📅 2009 🏛 Springer Berlin Heidelberg 🌐 English ⚖ 272 KB

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realize