[Springer Series in Surface Sciences] Kelvin Probe Force Microscopy Volume 48 || Electronic Properties of Metal/Organic Interfaces
β Scribed by Sadewasser, Sascha; Glatzel, Thilo
- Book ID
- 120429851
- Publisher
- Springer Berlin Heidelberg
- Year
- 2011
- Weight
- 534 KB
- Category
- Article
- ISBN
- 3642225667
No coin nor oath required. For personal study only.
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OverΒ the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostruc
OverΒ the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostruc
OverΒ the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostruc