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[Springer Series in Surface Sciences] Auger- and X-Ray Photoelectron Spectroscopy in Materials Science Volume 49 || Optimizing Certainty and the Detection Limit: Signal-to-Noise Ratio

✍ Scribed by Hofmann, Siegfried

Book ID: 118151869
Publisher: Springer Berlin Heidelberg
Year: 2012
Weight: 939 KB
Category: Article
ISBN: 3642273815
DOI: 10.1007/978-3-642-27381-0_6

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