[Springer Series in Chemical Physics] Ultrafast Phenomena XV Volume 88 || Carrier Dependent Stability of a Semiconductor Lattice Measured with Femtosecond X-ray Diffraction

✍ Scribed by Corkum, Paul; Jonas, David M.; Miller, R. J. Dwayne.; Weiner, Andrew M.

• Book ID: 115497475
• Publisher: Springer Berlin Heidelberg
• Year: 2007
• Weight: 190 KB
• Category: Article
• ISBN: 3540687793
• DOI: 10.1007/978-3-540-68781-8_227