✦ LIBER ✦

Spot profile analysis (LEED) of defects at silicon surfaces

✍ Scribed by M. Henzler

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Leed studies of defects at surfaces and

✍ M. Henzler 📂 Article 📅 1986 🏛 Elsevier Science ⚖ 85 KB

LEED spot profile analysis of the struct

✍ F.T. Wagner; P.N. Ross Jr 📂 Article 📅 1985 🏛 Elsevier Science ⚖ 114 KB

Step structure evolution on electrostati

✍ C. Kroll; M. Abraham; W. Göpel 📂 Article 📅 1991 🏛 Elsevier Science ⚖ 80 KB

Determination of the distribution of ste

✍ G.H. Rao; T. Hibma 📂 Article 📅 1991 🏛 Elsevier Science ⚖ 81 KB

Analysis of surface structural defects u

✍ Max G. Lagally 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 201 KB

Auger depth profiling and analysis of de

✍ J.S. Johannessen; A.P. Grande; T. Notevarp 📂 Article 📅 1980 🏛 Elsevier Science ⚖ 794 KB