Spontaneous emission lifetime of carriers in a semiconductor microcavity measured by photoluminescence without distortion by reabsorption

✍ Scribed by Park, S.; Zapasskii, V.; Wick, D.; Nelson, T.; Ell, C.; Gibbs, H.; Khitrova, G.; Schulzgen, A.; Kira, M.; Jahnke, F.

• Book ID: 115403171
• Publisher: Optical Society of America
• Year: 1999
• Tongue: English
• Weight: 277 KB
• Volume: 4
• Category: Article
• ISSN: 1094-4087
• DOI: 10.1364/OE.4.000512