SPMs for metrology
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 956 KB
- Volume
- 6
- Category
- Article
- ISSN
- 1369-7021
No coin nor oath required. For personal study only.
โฆ Synopsis
AFM probes and hints
Pacific Nanotechnology, Inc. now supplies replacement standard and specialty probes for most commercial scanning probe microscopes (SPMs). This includes SPMs from Digital Instruments, Veeco, TopoMetrix, Park Scientific, and ThermoMicroscopes. Standard AFM probes include pre-mounted, contact, noncontact, and tapping mode probes. Specialty probes include Si SPM sensors for lateral force, force modulation, electrostatic force, and magnetic force measurements. The company has also created a 'Developer's Corner' on its web-site that is intended for those who would like to modify an SPM instrument for a specific application. Example ideas and designs include how to construct a stand-alone AFM head and where to obtain probe tips for scanning in liquids.
๐ SIMILAR VOLUMES
During the last decade, the scanning probe microscope (SPM) has developed to a point where it is now an accessible, easy-to-use nanotechnology research tool.