✦ LIBER ✦
Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression
✍ Scribed by Chao-Wen Tzeng; Shi-Yu Huang
- Book ID
- 117908420
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 394 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0278-0070
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