Spin Transfer Magnetization Switching Read/Write Cycle Test in MgO-Based Magnetic Tunnel Junctions

✍ Scribed by Lee, J.M.; Ye, L.X.; Weng, M.C.; Chen, Y.C.; Li, S.C.; Su, J.P.; Te-ho Wu

• Book ID: 114652249
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 739 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2007.899146