The dependence of spin-cast polystyrene ยฎlm thickness on silicon substrates is examined as a function of concentration (in toluene) and molecular weight. For uniform ยฎlms ranging in thickness from 100 A ร to 1 mm, thickness follows a power law dependence on concentration, with the power varying from
Spin casting of polymer films
โ Scribed by D. H. Kaelble
- Publisher
- John Wiley and Sons
- Year
- 1965
- Tongue
- English
- Weight
- 465 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0021-8995
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