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SPIE Proceedings [SPIE Third International Conference on Thin Film Physics and Applications - Shanghai, China (Tuesday 15 April 1997)] Third International Conference on Thin Film Physics and Applications - Interface adhesion comparison of ZnS, SiO2 and Ag thin films deposited by vacuum coating method

✍ Scribed by Zhu, Ping; Ren, Hao; Zhou, Shixun; Wang, Yongling; Chen, Yi-Xin; Mao, Shuzheng

Book ID: 121198722
Publisher: SPIE
Year: 1998
Weight: 741 KB
Volume: 3175
Category: Article
DOI: 10.1117/12.300661

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