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SPIE Proceedings [SPIE The Hague '90, 12-16 April - The Hague, Netherlands (Thursday 1 March 1990)] Industrial Inspection II - New stereoscopic approach for the electro-optical coordinate measurement

✍ Scribed by Ahlers, Rolf-Juergen; Lu, Jianzhong A.; Braggins, Donald W.

No coin nor oath required. For personal study only.

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