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SPIE Proceedings [SPIE Symposium on Micromachining and Microfabrication - Santa Clara, CA (Monday 20 September 1999)] MEMS Reliability for Critical and Space Applications - Reliability issues of COTS MEMS for aerospace applications

✍ Scribed by Ramesham, Rajeshuni; Ghaffarian, Reza; Kim, Namsoo P.; Lawton, Russell A.; Miller, William M.; Lin, Gisela; Ramesham, Rajeshuni


Book ID
120975650
Publisher
SPIE
Year
1999
Weight
458 KB
Volume
3880
Category
Article

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