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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Wavelet Applications in Signal and Image Processing VII - Multiscale shape analysis: beyond the normality and independence of noise

โœ Scribed by He, Yun; Krim, A. Hamid; Unser, Michael A.; Aldroubi, Akram; Laine, Andrew F.


Book ID
121356443
Publisher
SPIE
Year
1999
Weight
398 KB
Volume
3813
Category
Article

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