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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Optical Manufacturing and Testing III - Precision calibration and systematic error reduction in the long trace profiler

✍ Scribed by Qian, Shinan; Sostero, Giovanni; Takacs, Peter Z.; Stahl, H. Philip

No coin nor oath required. For personal study only.

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