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SPIE Proceedings [SPIE SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics - Orlando, FL (Monday 17 April 1995)] Targets and Backgrounds: Characterization and Representation - Optimization of measurement process variables used in radiance uniformity calibration of the emitter source for the wideband infrared scene projector (WISP)

โœ Scribed by Malone, Charles L.; Flynn, David S.; Watkins, Wendell R.; Clement, Dieter


Book ID
121010787
Publisher
SPIE
Year
1995
Weight
894 KB
Volume
2469
Category
Article

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