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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Advanced Optical Manufacturing and Testing IV - Phase retardance and optical extinction symmetry measurements for some birefringent materials

✍ Scribed by Bukshtab, Michael A.; Mizell, Gregory J.; Doherty, Victor J.

No coin nor oath required. For personal study only.

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