SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Growth and Characterization of Materials for Infrared Detectors - Characterization of impurities and defects in InSb and HgCdTe using novel magneto-optical techniques

✍ Scribed by Littler, Chris L.; Longshore, Randolph E.; Baars, Jan W.

• Book ID: 121410924
• Publisher: SPIE
• Year: 1993
• Weight: 601 KB
• Volume: 2021
• Category: Article
• DOI: 10.1117/12.164943