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SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California, USA (Sunday 10 March 2013)] Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2013 - Multiple defect interpretation based on Gaussian processes for MFL technology

✍ Scribed by Wijerathna, Buddhi; Vidal-Calleja, Teresa; Kodagoda, Sarath; Zhang, Qiang; Valls Miro, Jaime; Yu, Tzu Yang; Gyekenyesi, Andrew L.; Shull, Peter J.; Diaz, Aaron A.; Wu, H. Felix; Aktan, A. Emin

Book ID: 120661421
Publisher: SPIE
Year: 2013
Weight: 758 KB
Volume: 8694
Category: Article
DOI: 10.1117/12.2009966

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