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SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California, USA (Sunday 10 March 2013)] Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2013 - Multiple defect interpretation based on Gaussian processes for MFL technology

โœ Scribed by Wijerathna, Buddhi; Vidal-Calleja, Teresa; Kodagoda, Sarath; Zhang, Qiang; Valls Miro, Jaime; Yu, Tzu Yang; Gyekenyesi, Andrew L.; Shull, Peter J.; Diaz, Aaron A.; Wu, H. Felix; Aktan, A. Emin


Book ID
120661421
Publisher
SPIE
Year
2013
Weight
758 KB
Volume
8694
Category
Article

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