SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California (Sunday 11 March 2012)] Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2012 - Damage detection and identification in smart structures using SVM and ANN

✍ Scribed by Farooq, M.; Zheng, H.; Nagabhushana, A.; Roy, S.; Burkett, S.; Barkey, M.; Kotru, S.; Sazonov, E.; Matikas, Theodore E.

• Book ID: 115473964
• Publisher: SPIE
• Year: 2012
• Weight: 469 KB
• Volume: 8346
• Category: Article
• DOI: 10.1117/12.915189