SPIE Proceedings [SPIE SPIE Remote Sensing - Dresden, Germany (Monday 23 September 2013)] Image and Signal Processing for Remote Sensing XIX - Soil surface roughness modeling: limit of global characterization in remote sensing

✍ Scribed by Chimi-Chiadjeu, O.; Vannier, E.; Dusséaux, R.; Taconet, O.; Bruzzone, Lorenzo

• Book ID: 121383711
• Publisher: SPIE
• Year: 2013
• Weight: 925 KB
• Volume: 8892
• Category: Article
• DOI: 10.1117/12.2028861