✦ LIBER ✦
SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - The new approach in the determination of the dependency of surface charge density on semiconductor surface potential based voltage: capacity analysis of the depletion region of MIS-structures
✍ Scribed by Chucheva, G. V.; Zhdan, A. G.; Valiev, Kamil A.; Orlikovsky, Alexander A.
- Book ID
- 120243355
- Publisher
- SPIE
- Year
- 2008
- Weight
- 231 KB
- Category
- Article
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