SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Coincidental multiple x-ray diffraction as tool for precise investigation of crystals

✍ Scribed by Borcha, M.; Fodchuk, I.; Kroitor, O.; Garabazhiv, Ya.; Kshevetsky, O.; Kujawinska, Malgorzata; Angelsky, Oleg V.

• Book ID: 120368423
• Publisher: SPIE
• Year: 2008
• Weight: 291 KB
• Category: Article
• DOI: 10.1117/12.797221