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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Coincidental multiple x-ray diffraction as tool for precise investigation of crystals

โœ Scribed by Borcha, M.; Fodchuk, I.; Kroitor, O.; Garabazhiv, Ya.; Kshevetsky, O.; Kujawinska, Malgorzata; Angelsky, Oleg V.


Book ID
120368423
Publisher
SPIE
Year
2008
Weight
291 KB
Category
Article

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