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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 16 April 2012)] Laser Sources and Applications - High-precision measurements of reflectance, transmittance, and scattering at 632.8 nm

✍ Scribed by Nasibov, Humbat; Graf, Thomas; Mackenzie, Jacob I.; Mamedbeili, Izmir; Riza, Dadash; Jelínková, Helena; Powell, John; Balaban, Ertan; Hacizade, Fikret

Book ID: 121460066
Publisher: SPIE
Year: 2012
Weight: 730 KB
Volume: 8433
Category: Article
DOI: 10.1117/12.921651

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